CLIC electrical breakdown studies: Cu self-sputtering MD simulations for 0.1-5 keV ions at elevated temperatures
dc.contributor.advisor | Zadin, Vahur, juhendaja | |
dc.contributor.advisor | Djurabekova, Flyura, juhendaja | |
dc.contributor.advisor | Avchaciov, Konstantin, juhendaja | |
dc.contributor.author | Metspalu, Tarvo | |
dc.contributor.other | Tartu Ülikool. Loodus- ja tehnoloogiateaduskond | et |
dc.contributor.other | Tartu Ülikool. Füüsika instituut | et |
dc.date.accessioned | 2015-06-09T11:44:35Z | |
dc.date.available | 2015-06-09T11:44:35Z | |
dc.date.issued | 2015 | |
dc.description.uri | http://www.ester.ee/record=b4482568 | et |
dc.identifier.uri | http://hdl.handle.net/10062/46783 | |
dc.language.iso | et | et |
dc.publisher | Tartu Ülikool | et |
dc.subject.other | magistritööd | et |
dc.subject.other | läbilöök (elektr.) | et |
dc.subject.other | vask | et |
dc.subject.other | molekulaardünaamika | et |
dc.title | CLIC electrical breakdown studies: Cu self-sputtering MD simulations for 0.1-5 keV ions at elevated temperatures | en |
dc.type | Thesis | et |