Capacitive behavior of atomic layer deposited nanomaterials for memories
dc.contributor.advisor | Kukli, Kaupo, Juhendaja | |
dc.contributor.advisor | Merisalu, Joonas, juhendaja | |
dc.contributor.author | Ofoegbu, Chinedu Henry | |
dc.contributor.other | Tartu Ülikool. Füüsika instituut | et |
dc.contributor.other | Tartu Ülikool. Loodus- ja täppisteaduste valdkond | et |
dc.date.accessioned | 2022-10-19T07:58:36Z | |
dc.date.available | 2022-10-19T07:58:36Z | |
dc.date.issued | 2022 | |
dc.identifier.uri | http://hdl.handle.net/10062/86716 | |
dc.language.iso | eng | et |
dc.publisher | Tartu Ülikool | et |
dc.rights | openAccess | et |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject.other | magistritööd | et |
dc.subject.other | kondenseeritud aine | et |
dc.subject.other | õhukesed kiled | et |
dc.subject.other | aatomkihtsadestamine | et |
dc.title | Capacitive behavior of atomic layer deposited nanomaterials for memories | en |
dc.type | Thesis | et |